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11
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0342803942
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-
note
-
A Jeol JEM 100CX II (100 kV) was used for TEM. A Philips CM 200 (200 kV) without field emission gun (FEG) was used for TEM high-tilt experiments.
-
-
-
-
12
-
-
0343238538
-
-
note
-
A Philips CM 200 (200 kV) with FEG was used for HRTEM and electron diffraction. Electron diffraction images are circularly averaged to get better homogeneity of the image and better separation of the diffractions.
-
-
-
-
13
-
-
0342369021
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-
note
-
Semper Version 6 was used to perform PS and image processing of electron diffraction.
-
-
-
-
14
-
-
0342803939
-
-
note
-
Cerius Version 5 was used to perform single-crystal diffraction calculations and structure simulation.
-
-
-
-
15
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0343238536
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-
EDS measurements were made with a Link AN 10 000
-
EDS measurements were made with a Link AN 10 000.
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-
-
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16
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0343238537
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-
note
-
Optical absorption spectra were obtained with a Cary (IE) spectrophotometer.
-
-
-
-
17
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0342368937
-
-
note
-
g is the bandgap energy [eV].
-
-
-
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20
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-
0342803938
-
-
note
-
g(bulk) is the bandgap of bulk CdS.
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-
-
-
22
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0343674182
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Fluorescence measurements by Spex Fluorolog 1681
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Fluorescence measurements by Spex Fluorolog (1681).
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-
-
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23
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0001537472
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J. Tanori, T. Gulik, M. P. Pileni, Langmuir 1997, 13, 632.
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26
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0033313487
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M. P. Pileni, B. W. Ninham, T. Gulik-Krzywicki, J. Tanori, I. Lisiecki, A. Filankembo, Adv. Mater. 1999, 11, 1358.
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Lisiecki, I.5
Filankembo, A.6
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27
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0000807611
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N. F. Bunkin, O. A. Kiseleva, A. V. Lobeyev, T. G. Movchan, B. W. Ninham, O. I. Vinogradova, Langmuir 1997, 13, 3024.
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Vinogradova, O.I.6
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28
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0001343216
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I. Lisiecki, P. André, A. Filankembo, C. Petit, J. Tanori, T. Gulik-Krzywicki, B. W. Ninham, M. P. Pileni, J. Phys. Chem. B 1999, 103, 9168.
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Gulik-Krzywicki, T.6
Ninham, B.W.7
Pileni, M.P.8
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29
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0000734094
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C. Petit, P. Lixon, M. P. Pileni, Langmuir 1991, 7, 2620.
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Petit, C.1
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