Bipolar resistance switching characteristics in a thin Ti-Ni-O compound film

Nanotechnology

Volumn 20, Issue 17, 2009, Pages

  Choi, Joonhyuk ^a   Song, Jaehoon ^a   Jung, Kyooho ^a   Kim, Yongmin ^a   Im, Hyunsik ^a   Jung, Woong ^a   Kim, Hyungsang ^a   Do, Young Ho ^b   Kwak, June Sik ^b   Hong, Jinpyo ^b  

^a Dongguk University   (South Korea)

^b Hanyang University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING STATE; PULSE SWITCHING; REPRODUCIBILITY; RESISTANCE SWITCHING; RESISTIVE SWITCHING; TI-NI-O; TI-O FILMS; X-RAY PHOTOELECTRON SPECTROSCOPIES;

NICKEL; SWITCHING;

X RAY PHOTOELECTRON SPECTROSCOPY;

NANOFILM; NICKEL; OXYGEN; TITANIUM;

ARTICLE; BINDING AFFINITY; ELECTRODE; MICROSCOPY; MOLECULAR MECHANICS; PRIORITY JOURNAL; REPRODUCIBILITY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 65149104934     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/17/175704     Document Type: Article

References (28)

1. Waser R 2003 Nanoelectronics and Information Technology (Weinheim: Wiley-VCH) pp565-605
2. Waser R and Aono M 2007 Nat. Mater. 6 833
3. Jeong D S et al 2007 Electrochem. Solid-State Lett. 10 G51
4. Strukov D B et al 2008 Nature 453 80
5. Rohde C, Choi B J, Jeong D S, Choi S, Zhao J-S and Hwang C S 2005 Appl. Phys. Lett. 86 262907
6. Jung K, Choi J, Kim Y, Im H, Seo S, Jung R, Kim D C, Kim J S, Park B H and Hong J P 2008 J. Appl. Phys. 103 034504
7. Lin C-Y, Wu C-Y, Wu C-Y, Hu C and Tseng T-Y 2007 J. Electrochem. Soc. 154 G189
8. Beck A, Bednorz J G, Gerber Ch, Rossel C and Widmer D 2000 Appl. Phys. Lett. 77 139
9. Liu S Q, Wu N J and Ignativ A 2000 Appl. Phys. Lett. 76 2749
10. Hyun J W 2004 J. Korean Phys. Soc. 44 381
11. Jeong D S, Schroeder H and Waser R 2006 Appl. Phys. Lett. 89 082909
12. Jung K, Seo H, Kim Y, Im H, Hong J P, Park J W and Lee J K 2007 Appl. Phys. Lett. 90 052104
13. Dong R et al 2007 Appl. Phys. Lett. 90 042107
14. Ogimoto Y, Tamai Y, Kawasaki M and Tokura Y 2007 Appl. Phys. Lett. 90 143515
15. Odagawa A, katoh Y, Kanzawa Y, Wei Z, Mikawa T, Muraoka S and Takagi T 2007 Appl. Phys. Lett. 91 133503
16. Do Y D, Kwak J S, Hong J P, Jung K and Im H 2008 J. Appl. Phys. 104 114512
17. Brown G M, Shimizu K, Kobayashi K, Skeldon P, Thompson G E and Wood G C 1998 Corros. Sci. 40 1575
18. Jung K, Seo H, Kim N, Kim Y, Im H, Park J W, Yang M K and Lee J K 2006 J. Korean Phys. Soc. 49 1071
19. Park J W, Yang M K, Jung K and Lee J K 2008 IEEE Trans. Electron Devices 55 7
20. Briggs D and Seah M P 1990 Practical Surface Analysis: Volume 1. Auger and X-ray Photoelectron Spectroscopy (Chichester: Wiley) p543
21. Gu Y W, Tay B Y, Lim C S and Yong M S 2005 Appl. Surf. Sci. 252 2038
22. Hillebrecht F U, Fuggle J C, Bennett P A and Zolnierek Z 1983 Phys. Rev. B 27 2179
23. Wang R M, Chu C L, Hua T, Dong Y S, Guo C, Sheng X B, Lin P H, Chung C Y and Chu P K 2007 Appl. Surf. Sci. 253 8507
24. Kim K S and Winograd N 1974 Surf. Sci. 43 625
25. Lorenz P, Finster J, Wendt G, Salyn J V, Zumadilov E K and Nefedov V I 1979 J. Electron Spectrosc. Relat. Phenom. 16 267
26. Li C P, Proctor A and Hercules D M 1984 Appl. Spectrosc. 38 6
27. Matienzo J, Yin Lo I, Grim S O and Swartz W E 1973 Inorg. Chem. 12 2762
28. Furstenau R P, McDougall G and Langell M A 1985 Surf. Sci. 150 1