Electrochemical and thermochemical memories

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 2008, Pages

  Waser, Rainer ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

MEMORY CELLS; MEMORY EFFECTS; NANO-SCALE; NON VOLATILES; SCALABLE MEMORIES; UNDERLYING MECHANISMS;

ELECTRON DEVICES;

DATA STORAGE EQUIPMENT;

EID: 64549148824     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2008.4796675     Document Type: Conference Paper

References (29)

1. A. Asamitsu et al., Nature, 388, 50 (1997).
2. M. N. Kozicki et al., Electrochem. Soc. 298 (1999).
3. A. Beck et al., Appl. Phys. Lett. 77, 139 (2000).
4. R. Waser et al., Nature Materials. 6, 833 (2007).
5. A. Sawa, materials today 11, 28 (2008).
6. K. Terabe et al., Nature 433, 47 (2005).
7. X. Guo et al., Appl. Phys. Lett. 91, 1 (2007).
8. C. Schindler et al., Proc. NVMTS (2007).
9. C. Schindler et al., Appl. Phys. Lett.29, 129 (2008).
10. M. Kund et al., IEDM Techn. Dig. 754, (2005).
11. S. Dietrich et al., IEEE JSSC 42, 839 (2007).
12. T. Baiatu et al., J. Am. Cer. Soc. 73, 1663 (1990).
13. R. Pinto, Physics Letters A 35, 155 (1971).
14. B. J. Choi et al., J. Appl. Phys. 98, 33715 (2005).
15. J. J. Yang et al., Nanotechnology 103, (2008).
16. C. Rossel et al., J. Appl. Phys. 90, 2892 (2001).
17. K. Szot et al., Nature Materials 5, 312 (2006).
18. B. Dmitri et al., Nature 453, 80 (2008).
19. H. Pagnia, N. Sotnik, Phys. Stat. Sol. 108, 11 (1988).
20. F. A. Chudnovskii et al., J. Solid State Chem. 122, 95 (1996).
21. D. C. Kim et al., Appl. Phys. Lett. 88, 202102 (2006).
22. I. G. Baek et al., IEDM Techn. Dig. 587 (2005).
23. D. S. Jeong et al., Electrochemical and Solid-State Letters (2007).
24. M. J. Lee et al., Adv. Mat. 19, 73 (2007).
25. J. R. Heath et al., Science 280, 1716 (1998).
26. G. Snider et al., Appl. Phys. A80, 1183 (2005).
27. A. DeHon et al., Microprocessors and Microsystems 30, 301 2006).
28. K. K. Likharev et al., Lecture Notes in Physics, 680, 447 (2006).
29. M.J. Lee et al., IEDM Techn. Dig. 771 (2007).