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Volumn 517, Issue 12, 2009, Pages 3488-3491
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Post deposition annealing temperature effect on silicon quantum dots embedded in silicon nitride dielectric multilayer prepared by hot-wire chemical vapor deposition
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Author keywords
Photoluminescence; Raman analysis; Si QD SiNx multilayer
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Indexed keywords
A DENSITIES;
A-SI:H;
ANNEALING TEMPERATURES;
ANNEALING TREATMENTS;
CONFOCAL MICRO-RAMAN;
CRYSTALLINE PHASE;
DEPOSITION CHAMBERS;
DIELECTRIC MULTILAYERS;
FILM STRUCTURES;
HIGH-RESOLUTION TEM;
HOT-WIRE CHEMICAL VAPOR DEPOSITIONS;
LINE-SHIFTING;
MICRO-RAMAN ANALYSIS;
PEAK SHIFTING;
PL SPECTRUM;
POST-DEPOSITION ANNEALING;
RAMAN ANALYSIS;
SI QUANTUM DOTS;
SI-QD/SINX MULTILAYER;
SILICON QUANTUM DOTS;
TEM;
TEMPERATURE RANGES;
TRANSMISSION ELECTRON MICROSCOPES;
AGGLOMERATION;
ANNEALING;
CHEMICAL ANALYSIS;
CHEMICAL VAPOR DEPOSITION;
FILM PREPARATION;
MULTILAYERS;
OPTICAL WAVEGUIDES;
PHOTOLUMINESCENCE;
SEMICONDUCTOR QUANTUM DOTS;
SILICON;
SILICON NITRIDE;
THERMAL EFFECTS;
TRANSMISSION ELECTRON MICROSCOPY;
VAPORS;
WIRE;
AMORPHOUS SILICON;
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EID: 64349101084
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2009.01.080 Document Type: Article |
Times cited : (15)
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References (22)
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