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Volumn 517, Issue 12, 2009, Pages 3488-3491

Post deposition annealing temperature effect on silicon quantum dots embedded in silicon nitride dielectric multilayer prepared by hot-wire chemical vapor deposition

Author keywords

Photoluminescence; Raman analysis; Si QD SiNx multilayer

Indexed keywords

A DENSITIES; A-SI:H; ANNEALING TEMPERATURES; ANNEALING TREATMENTS; CONFOCAL MICRO-RAMAN; CRYSTALLINE PHASE; DEPOSITION CHAMBERS; DIELECTRIC MULTILAYERS; FILM STRUCTURES; HIGH-RESOLUTION TEM; HOT-WIRE CHEMICAL VAPOR DEPOSITIONS; LINE-SHIFTING; MICRO-RAMAN ANALYSIS; PEAK SHIFTING; PL SPECTRUM; POST-DEPOSITION ANNEALING; RAMAN ANALYSIS; SI QUANTUM DOTS; SI-QD/SINX MULTILAYER; SILICON QUANTUM DOTS; TEM; TEMPERATURE RANGES; TRANSMISSION ELECTRON MICROSCOPES;

EID: 64349101084     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.01.080     Document Type: Article
Times cited : (15)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.