Dielectric characterization of low-loss materials: A comparison of techniques

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 5, Issue 4, 1998, Pages 571-577

  Baker Jarvis, James ^a   Geyer, Richard G ^a   Grosvenor Jr , John H ^a   Janezic, Michael D ^a   Jones, Chriss A ^a   Riddle, Bill ^a   Weil, Claude M ^a   Krupka, Jerzy ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

CAVITY RESONATORS; DIELECTRIC DEVICES; ELECTRIC LOSSES;

DIELECTRIC RESONATORS;

ELECTRIC INSULATING MATERIALS;

EID: 0032138767     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/94.708274     Document Type: Review

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