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Volumn 3, Issue , 2004, Pages 1825-1828

Complex permittivity measurements at variable temperatures of low loss dielectric substrates employing split post and single post dielectric resonators

Author keywords

Dielectric materials; Dielectric resonators; Permittivity measurements; Superconducting devices

Indexed keywords

COMPUTATIONAL METHODS; CRYSTALS; CYLINDERS (SHAPES); DIELECTRIC MATERIALS; MICROWAVE DEVICES; PERMITTIVITY MEASUREMENT; SUBSTRATES; SUPERCONDUCTING DEVICES;

EID: 4544386472     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (18)

References (12)
  • 1
    • 0019530308 scopus 로고
    • Local complex permittivity measurements of MIC substrates
    • J. DelaBalle, P.Guillon, and Y. Garault, "Local complex permittivity measurements of MIC substrates", AEU Electronics and Comm, vol. 35, pp. 80-83, 1981.
    • (1981) AEU Electronics and Comm , vol.35 , pp. 80-83
    • Delaballe, J.1    Guillon, P.2    Garault, Y.3
  • 2
    • 0006776722 scopus 로고
    • 01δ mode dielectric resonator for the complex permittivity measurements of semiconductors
    • 01δ mode dielectric resonator for the complex permittivity measurements of semiconductors", Proceedings of CPEM '86, pp. 154-155, 1986.
    • (1986) Proceedings of CPEM '86 , pp. 154-155
    • Krupka, J.1    Maj, S.2
  • 3
    • 0006773877 scopus 로고
    • Precise measurement method for complex permittivity of microwave substrate
    • Nishikawa T. et al, "Precise measurement method for complex permittivity of microwave substrate", Proceedings of CPEM '88, pp. 154-155, 1988.
    • (1988) Proceedings of CPEM '88 , pp. 154-155
    • Nishikawa, T.1
  • 4
    • 0002173701 scopus 로고    scopus 로고
    • Measurements of the complex permittivity of microwave circuit board substrates using split dielectric resonator and reentrant cavity techniques
    • 23-26 Sept.
    • J. Krupka, R.G. Geyer, J. Baker-Jarvis, and J. Ceremuga, "Measurements of the complex permittivity of microwave circuit board substrates using split dielectric resonator and reentrant cavity techniques", Proceedings of DMMA'96 Conf., Bath, U.K., 23-26 Sept. pp. 21-24, 1996.
    • (1996) Proceedings of DMMA'96 Conf., Bath, U.K. , pp. 21-24
    • Krupka, J.1    Geyer, R.G.2    Baker-Jarvis, J.3    Ceremuga, J.4
  • 6
    • 0041689549 scopus 로고    scopus 로고
    • Measurements of loss tangent and relative permittivity of LTCC ceramics at varying temperatures and frequencies
    • Elsevier
    • J. Mazierska et al, "Measurements of Loss Tangent and Relative Permittivity of LTCC Ceramics at Varying Temperatures and Frequencies", Journal of European Ceramic Society, Elsevier, vol. 23, pp. 2611-2615, 2003.
    • (2003) Journal of European Ceramic Society , vol.23 , pp. 2611-2615
    • Mazierska, J.1
  • 8
    • 1642385144 scopus 로고    scopus 로고
    • Cryogenic post dielectric resonator for precise microwave characterization of planar dielectric materials for superconducting circuits
    • M. V. Jacob, J. Mazierska, and J. Krupka: "Cryogenic Post Dielectric Resonator for Precise Microwave Characterization of Planar Dielectric Materials for Superconducting Circuits", Superconducting Science and Technology, vol.17, pp. 358-362, 2004.
    • (2004) Superconducting Science and Technology , vol.17 , pp. 358-362
    • Jacob, M.V.1    Mazierska, J.2    Krupka, J.3
  • 9
    • 0036733119 scopus 로고    scopus 로고
    • Precise measurements of the Q-factor of transmission mode dielectric resonators: Accounting for noise, crosstalk, coupling loss and reactance, and uncalibrated transmission lines
    • K. Leong, J. Mazierska: "Precise Measurements of the Q-factor of Transmission Mode Dielectric Resonators: Accounting for Noise, Crosstalk, Coupling Loss and Reactance, and Uncalibrated Transmission Lines", IEEE Transactions on Microwave Theory and Techniques, vol. 50, No. 9, pp. 2115-2127, 2002.
    • (2002) IEEE Transactions on Microwave Theory and Techniques , vol.50 , Issue.9 , pp. 2115-2127
    • Leong, K.1    Mazierska, J.2
  • 11
    • 0032679901 scopus 로고    scopus 로고
    • Complex permittivity of some ultralow loss dielectric crystals at cryogenic temperatures
    • J. Krupka et al, "Complex permittivity of some ultralow loss dielectric crystals at cryogenic temperatures", Measurement Science and Technology, vol. 10, pp.387-392, 1999.
    • (1999) Measurement Science and Technology , vol.10 , pp. 387-392
    • Krupka, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.