Surface and interface studies at APS endstation 5ID-C

AIP Conference Proceedings

Volumn 705, Issue , 2004, Pages 1166-1169

  Walko, D A ^a   Sakata, O ^a   Lyman, P F ^a   Lee, T L ^a   Tinkham, B P ^a   Okasinski, J S ^a   Zhang, Z ^a   Bedzyk, M J ^a  

^a Northwestern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85012255102     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.1758007     Document Type: Conference Paper

References (7)

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3. Certified Scientific Software, Cambridge, MA.
4. Tinkham, B.P., Goodner, D.M., Walko, D.A., and Bedzyk, M.J., Phys. Rev. B 67, 035404 (2003).
5. Lyman, P.F., Keane, D.T., and Bedzyk, M.J., "UHV Surface-Analysis Endstation with X-ray Scattering and Spectroscopic Capabilities" in Synchrotron Radiation Instrumentation: Tenth US National Conference, edited by E. Fontes, AIP Conference Proceedings 417, American Institute of Physics, New York, 1997, pp. 10-14.
6. You, H., J. Appl. Cryst. 32, 614-623 (1999).
7. Quintana, J.P.G., J. Synchrotron Rad. 5, 600-602 (1998).