Scanning transmission x-ray microscopy with a configurable detector

Applied Physics Letters

Volumn 89, Issue 25, 2006, Pages

  Gianoncelli, A ^a,d   Morrison, G R ^a   Kaulich, B ^b   Bacescu, D ^b   Kovac, J ^c  

^a KING'S COLLEGE LONDON   (United Kingdom)

^b SINCROTRONE TRIESTE   (Italy)

^c JO EF STEFAN INSTITUTE   (Slovenia)

^d CENTRE DE RECHERCHE ET DE RESTAURATION DES MUSÉES DE FRANCE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; IMAGE PROCESSING; MICROSCOPIC EXAMINATION; PHOTONS; REAL TIME SYSTEMS; X RAY ANALYSIS;

INTENSITY DISTRIBUTION; PHOTON ENERGY; RASTER SCAN; SCANNING TRANSMISSION X-RAY MICROSCOPY;

CHARGE COUPLED DEVICES;

EID: 33845933086     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2422908     Document Type: Article

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