Scanning differential-phase-contrast hard X-ray microscopy with wedge absorber detector

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 43, Issue 11 A, 2004, Pages

  Kagoshima, Yasushi ^a   Shimose, Ken Ich ^a   Koyama, Takahisa ^a   Wada, Izumi ^a   Saikubo, Akihiko ^a   Hayashi, Kenji ^a   Tsusaka, Yoshiyuki ^a   Matsui, Junji ^a  

^a UNIVERSITY OF HYOGO   (Japan)

Author keywords

Differential phase contrast; Hard X ray; Phase contrast; Phase gradient; Phase shift; Scanning microscope; Synchrotron radiation; X ray microscope; Zone plate

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; COMPUTER SIMULATION; IMAGE ANALYSIS; PHASE SHIFT; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SYNCHROTRON RADIATION; X RAY ANALYSIS;

DIFFERENTIAL PHASE CONTRAST; PHASE GRADIENT; SCANNING MICROSCOPES; ZONE PLATE CONTRAST;

X RAY MICROSCOPES;

EID: 11144255026     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.43.L1449     Document Type: Article

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