A method to extract quantitative information in analyzer-based x-ray phase contrast imaging

Applied Physics Letters

Volumn 82, Issue 20, 2003, Pages 3421-3423

  Pagot, E ^a   Cloetens, P ^a   Fiedler, S ^a   Bravin, A ^a   Coan, P ^a   Baruchel, J ^a   Hartwig J ^a   Thomlinson, W ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE REFRACTION; ELECTROMAGNETIC WAVE SCATTERING; MATHEMATICAL MODELS; RADIOGRAPHY; STATISTICAL METHODS;

X-RAY IMAGING;

IMAGING TECHNIQUES;

EID: 0038725555     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1575508     Document Type: Article

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