An investigation of the mode characteristics of SOI submicron rib waveguides using the film mode matching method

Journal of Optics A: Pure and Applied Optics

Volumn 11, Issue 1, 2009, Pages

  Xu, Xuejun ^a   Chen, Shaowu ^a   Yu, Jinzhong ^a   Tu, Xiaoguang ^a  

^a INSTITUTE OF SEMICONDUCTORS   (China)

Author keywords

Film mode matching; Mode coupling; Rib waveguides; Single mode condition

Indexed keywords

OPTICAL DEVICES; REFRACTIVE INDEX; THICKNESS MEASUREMENT;

ANALYTICAL RESULTS; INTERFERENCE THEORIES; MODE CHARACTERISTICS; MODE COUPLING; MODE-MATCHING METHODS; NUMERICAL SIMULATIONS; RIB WAVEGUIDES; SILICON ON INSULATORS; SINGLE-MODE CONDITION; SUBMICRON RIB WAVEGUIDES; TM MODES; TOTAL INTERNAL REFLECTIONS; WAVEGUIDE MODES;

WAVEGUIDES;

EID: 63649131754     PISSN: 14644258     EISSN: 17413567     Source Type: Journal    
DOI: 10.1088/1464-4258/11/1/015508     Document Type: Article

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