Width dependence of inherent TM-mode lateral leakage loss in silicon-on-insulator ridge waveguides

IEEE Photonics Technology Letters

Volumn 19, Issue 6, 2007, Pages 429-431

  Webster, M A ^a   Pafchek, R M ^a   Mitchell, A ^b   Koch, T L ^a  

^a LEHIGH UNIVERSITY   (United States)

^b RMIT UNIVERSITY   (Australia)

Author keywords

Leaky waves; Optical losses; Optical waveguides; Silicon on insulator (SOI) technology

Indexed keywords

ACTIVE COMPONENTS; ACTIVE DEVICES; EXPERIMENTAL OBSERVATION; LEAKAGE LOSS; LEAKY MODES; LEAKY WAVES; MODE OPERATION; OPTICAL DOMAINS; PRECISION CONTROL; RIDGE WAVEGUIDES; SILICON ON INSULATOR; SILICON PHOTONICS; SILICON-ON-INSULATOR (SOI) TECHNOLOGY; TM-MODE; WAVEGUIDE DIMENSIONS; WAVEGUIDE GEOMETRY;

ELECTRIC LOSSES; INTEGRATED OPTOELECTRONICS; MICROSENSORS; NUMERICAL METHODS; OPTICAL WAVEGUIDES; WAVEGUIDES;

SILICON ON INSULATOR TECHNOLOGY;

EID: 38049137553     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2007.891979     Document Type: Article

References (7)

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