Sn-CeO 2 thin films prepared by rf magnetron sputtering: XPS and SIMS study

Applied Surface Science

Volumn 255, Issue 13-14, 2009, Pages 6656-6660

  Mašek, Karel ^a   Václavů, Michal ^a   Bábor, Petr ^b   Matolín, Vladimír ^a  

^a CHARLES UNIVERSITY   (Czech Republic)

^b BRNO UNIVERSITY OF TECHNOLOGY   (Czech Republic)

Author keywords

Cerium oxide; Magnetron sputtering; SIMS; Tin cerium mixed oxide; XPS

Indexed keywords

CHARGE TRANSFER; FILM GROWTH; MAGNETRON SPUTTERING; OXIDE FILMS; SECONDARY ION MASS SPECTROMETRY; THIN FILMS; TIN OXIDES; X RAY PHOTOELECTRON SPECTROSCOPY;

CEO2 LAYERS; MIXED OXIDE; RF-MAGNETRON SPUTTERING;

CERIUM OXIDE;

EID: 63449116470     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.02.080     Document Type: Article

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