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Volumn 345, Issue 3, 1996, Pages 290-302
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Formation of the Ce/Y2O3 interface: An in situ XPS study
a
CEA SACLAY
(France)
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Author keywords
Cerium; Growth; Oxidation; Polycrystalline surfaces; X ray photoelectron spectroscopy; Yttrium oxide
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Indexed keywords
CERIUM;
DEPOSITION;
DIFFUSION;
MATHEMATICAL MODELS;
OXIDATION;
OXYGEN;
POLYCRYSTALLINE MATERIALS;
SURFACES;
TEMPERATURE;
VAPOR PHASE EPITAXY;
X RAY PHOTOELECTRON SPECTROSCOPY;
YTTRIUM COMPOUNDS;
LAYER THICKNESS;
PHOTOELECTRON LINES;
YTTRIUM OXIDE;
INTERFACES (MATERIALS);
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EID: 0029774941
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/0039-6028(95)00883-7 Document Type: Article |
Times cited : (19)
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References (22)
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