A resonant photoelectron spectroscopy study of Sn(Ox) doped CeO2 catalysts

Surface and Interface Analysis

Volumn 40, Issue 3-4, 2008, Pages 225-230

  Matolin V ^a   Cabala, M ^a   Chab V ^c   Matolinova I ^a   Prince, K C ^b   Skoda M ^a   Sutara F ^a   Skala T ^b   Veltruska K ^a  

^a CHARLES UNIVERSITY   (Czech Republic)

^b SINCROTRONE TRIESTE   (Italy)

^c INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

CeO2; Mixed oxide; Resonance spectroscopy; Sn; Synchrotron radiation; XPS

Indexed keywords

CATALYSTS; PHOTOELECTRON SPECTROSCOPY; RESONANCE; SYNCHROTRON RADIATION; THIN FILMS;

CONCENTRATION ENHANCEMENT; RESONANT PHOTOELECTRON SPECTROSCOPY (RPES);

CERIUM COMPOUNDS;

EID: 42449103455     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2625     Document Type: Conference Paper

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