The measurement of ferroelectric thin films using piezo force microscopy

2004 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2004

Volumn 3, Issue , 2004, Pages 362-365

  Cain, M G ^a   Dunn, S ^b   Jones, P ^b  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^b CRANFIELD UNIVERSITY   (United Kingdom)

Author keywords

AFM; Characterisation; Ferroelectric; Piezo force microscopy; Thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; COUPLED CIRCUITS; DATA STORAGE EQUIPMENT; ELECTRIC SIGNAL SYSTEMS; FERROELECTRIC MATERIALS; MICROELECTROMECHANICAL DEVICES;

BULK PROPERTIES; OPTO-ELECTRONIC SYSTEMS; PIEZO FORCE MICROSCOPY; PYROELECTRIC DETECTORS;

MAGNETIC THIN FILMS;

EID: 6344280230     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)

1. O.Kolosov et al., "Nanoscale Visualisation and control of ferroelectric domains by atomic force microscopy", Physical Review letters, Vol.74, No. 21, May 1995.
2. A.Gruverman, "Domain structure and polarisation reversal in ferroelectrics studied by atomic force microscopy", Journal of Vacuum Science and Technology, B13, Issue 3, 1995.
3. S.V.Kalinin et al., "Temperature dependence of polarisation and charge dynamics on the BaTiO3 (100) surface by scanning probe microscopy", Applied Physics Letters, Vol 78. No.8. Feb 2001.
4. A.Gruverman et al., "Nanoscale imaging of domain dynamics and retention in ferroelectric thin films", Applied Physical Letters, 71(24), Pgs 3492-3494, Dec 1997.
5. A.L.Kholkin et al., "Electromechanical properties of lead based ferroelectric thin films", Proceedings of the Materials Research Society Symposium, Vol. 541. Pgs 623-628, 1999.
6. B.J.Rodriguez et al., "Piezoresponse force microscopy for piezoelectric measurements of III-nitride materials", Journal of crystal growth, Vol 246, pgs 252-258, 2002.
7. A.L.Kholkin et al, "Seeding effect on micro- and domain structures of sol-gel derived PZT thin film", Materials Letters. Vol. 50, pgs 219-224, 2001
8. C.Durkan et al., "Investigation into local ferroelectric properties by atomic force microscopy", Ultramicroscopy Vol. 82, pgs 141 - 148, 2000.
9. S.Hong et al., "High resolution study of domain nucleation and growth during polarisation switching in Pb(Zr,Ti)O3 ferroelectric thin film capacitors", Journal of Applied Physics. Vol, 86, No. 1. July 1999.
10. S.Dunn et al., "Substrate effect on domain structures of PZT 30/70 sol-gel films via PiezoAFM", Journal of European Ceramic Society Vol. 22, pgs 825-833, 2002.
11. P.Lehnen et al., "Ferroelectric domain structures of PbTiO3 studied by scanning force microscopy", Journal of Applied Physics, Vol 33, pgs 1932-1936, 2000.
12. Desheng Fu et al., "Local Piezoelectric response in Bismuth-Base Ferroelectric thin films investigated by scanning force microscopy", Japanese Journal of Applied Physics, Vol. 41, pgs 1103-1105, 2002.
13. S.S.Roy et al., "Growth and characterisation of Lead Zirconate Titanate (30/70) on indium tin oxide coated glass for oxide ferroelectric-liquid crystal display application", Integrated ferroelectrics, Vol.29, pgs 189-213, 2000.
14. Q.Zhang et al., "Sol-gel PZT and Mn-doped PZT thin films for Pyroelectric applications", Journal of Physics D: Applied Physics (0022-3727), Vol. 34, No. 15, pgs. 2296-2307, 2001
15. M.Abplanalp et al., "Imaging of Ferroelectric domains with sub micrometer resolution by scanning force microscopy", ISAF 98. Proceedings of the Eleventh IEEE International Symposium on applications of ferroelectrics, pgs 423 -426 Aug 1998