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Volumn , Issue , 1998, Pages 423-426
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Imaging of ferroelectric domains with sub micrometer resolution by scanning force microscopy
a
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Author keywords
[No Author keywords available]
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Indexed keywords
FERROELECTRIC DOMAINS;
SCANNING FORCE MICROSCOPY (SFM);
MORPHOLOGY;
OPTICAL RESOLVING POWER;
PIEZOELECTRICITY;
POLARIZATION;
FERROELECTRIC MATERIALS;
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EID: 0032285842
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (7)
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References (10)
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