Substrate effects on domain structures of PZT 30/70 sol-gel films via PiezoAFM

Journal of the European Ceramic Society

Volumn 22, Issue 6, 2002, Pages 825-833

  Dunn, S ^a   Whatmore, R W ^a  

^a CRANFIELD UNIVERSITY   (United Kingdom)

Author keywords

AFM; Perovskites; Piezoelectric properties; PZT; Sol gel methods; Substrate; Thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; COERCIVE FORCE; GLASS; HYSTERESIS; PIEZOELECTRICITY; SPIN COATING; SUBSTRATES; THIN FILMS;

DOMAIN STRUCTURES;

SOL-GELS;

FILM; PIEZOELECTRICITY; SOL-GEL PROCESS;

EID: 0036604554     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0955-2219(01)00402-2     Document Type: Article

References (17)

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6. Ferroelectric domain structures studied by piezoresponse scanning force microscopy
7. Local poling of ferroelectric polymers by scanning force microscopy
8. An examination of thin film lead scandium tantalum oxide (PST) using piezoAFM
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10. Effects of alloying platinum bottom electrode with silver: In relation to CFD processing of PZT thin films
11. Structural development in the early stages of annealing of sol-gel prepared lead zirconate titanate thin films
12. Growth and characterisation of lead zirconate titanate (30/70) on indium tin oxide coated glass for oxide ferroelectric-liquid crystal display application
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14. Pyroelectric properties of solgel PZT and Mn doped PZT thin films