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Volumn 19, Issue 9, 2004, Pages 2725-2729

Room-temperature growth of ultrasmooth AlN epitaxial thin films on sapphire with NiO buffer layer

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FILM GROWTH; MORPHOLOGY; NICKEL COMPOUNDS; PULSED LASER DEPOSITION; SAPPHIRE; STRUCTURE (COMPOSITION); SURFACES; THERMAL EFFECTS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 6344278050     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2004.0346     Document Type: Article
Times cited : (14)

References (28)
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