Fault detection and diagnosis techniques for molecular computing

2004 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2004

Volumn 3, Issue , 2004, Pages 57-60

  Tahoori, Mehdi B ^a   Mitra, Subhasish ^b  

^a NORTHEASTERN UNIVERSITY   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

BIST; Defect tolerance; Diagnosis; Fault tolerance; Molecular electronics; Self repair; Test

Indexed keywords

ALGORITHMS; APPLICATION SPECIFIC INTEGRATED CIRCUITS; BUILT-IN SELF TEST; DIAGNOSIS; ELECTRONIC EQUIPMENT; FIELD PROGRAMMABLE GATE ARRAYS; LITHOGRAPHY; MATHEMATICAL MODELS; REPAIR;

DEFECT-TOLERANCE; MOLECULAR COMPUTING SYSTEM; MOLECULAR ELECTRONICS; SELF-REPAIR;

FAULT TOLERANT COMPUTER SYSTEMS;

EID: 6344277047     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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