Ch. 23. Step-stress accelerated life test

Handbook of Statistics

Volumn 20, Issue , 2001, Pages 623-693

  Gouno, E ^a   Balakrishnan, N ^a  

^a NONE

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EID: 4544221454     PISSN: 01697161     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S0169-7161(01)20025-X     Document Type: Review

References (25)

1. Bagdonavicius V.B. Accelerated life models when the stress is not constant. Kybernetika 26 (1990) 289-295
2. Bagdonavicius V.B., and Nikulin M.S. Transfer functionals and semiparametric regression models. Biometrika 84 (1997) 365-378
3. Bai D.S., Kim M.S., and Lee S.H. Optimum simple step-stress accelerated life tests with censoring. IEEE Trans. Rehab. 38 (1989)
4. Chernoff H. Optimum accelerated life design for estimation. Technometrics 4 (1962) 381-408
5. Cox D.R. Regression models and life-tables. J. Roy. Stat. Soc. Ser. B 34 (1972) 187-220
6. DeGroot M.H., and Goel P.K. Bayesian estimation and optimal designs in partially accelerated life testing. Naval Res. Logist. Quart. 26 (1979) 223-235
7. Dietrich D.L., and Mazzuchi A.M. An alternative method of analysing multi-stress multi-level life and accelerated life tests. Proceedings of Annual Reliability and Maintainability Symposium (1996)
8. Gouno E. An inference method for temperature step-stress accelerated life test. Quality and Reliab. Eng. Int. (1999)
9. Jensen F. Activation energies and the Arrhenius equation. Quality and Reliab. Eng. Int. 1 (1985) 13-17
10. Johnson N.L., Kotz S., and Balakrishnan N. Continuous Univariate Distributions. 2nd edn vol. 1 (1994), Wiley, New York
11. Khamis I.H. Optimum M-step, step-stress test with k stress variables. IEEE Trans. Reliab. 47 (1997)
12. Khamis I.H., and Higgins J.J. An alternative to the Weibull cumulative exposure model. Proceedings of the American Statistical Association, Section on Quality and Productivity (1996)
13. Khamis I.H., and Higgins J.J. A new model for step-stress testing. IEEE Trans. Reliab. 47 (1998)
14. Lawless J.F. Statistical Models and Methods for Lifetime Data (1982), Wiley, New York
15. Miller R., and Nelson W. Optimum simple step-stress plans for accelerated life testing. IEEE Trans. Reliab. 32 (1983)
16. Nachlas J.A. A general model for age acceleration during thermal cycling. Quality and Reliab. Eng. Int. 2 (1986) 3-6
17. Nelson W. Accelerated life testing - step-stress model and data analysis. IEEE Trans. Reliab. 29 (1980) 103-108
18. Nelson W. Accelerated Testing (1990), Wiley, New York
19. Schmoyer R.L. An exact distribution-free analysis for accelerated life testing at several levels of a single stress. Technometrics 28 (1986) 165-175
20. Shaked M., and Singpurwalla N.D. Inference for step-stress accelerated life tests. J. Stat. Planning and Inference 7 (1983) 295-306
21. Singpurwalla N.D. Survival in dynamic environments. Stat. Sci. 10 (1995) 86-103
22. Tang L.C., Sun Y.S., Goh T.N., and Ong H.L. Analysis of step-stress accelerated-life test data: a new approach. IEEE Trans. Reliab. 45 (1996)
23. Tobias P.A., and Trindade D. Applied Reliability (1986), Van Nostrand Reinhold, New York
24. Van Dorp J.R., Mazzuchi T.A., Fornell G.E., and Pollock L.R. A Bayes approach to step-stress accelerated life testing. IEEE Trans. Reliab. 38 (1995)
25. Xiong C. Inferences on a simple step-stress model with type-II censored exponential data. IEEE Trans. Reliab. 47 (1998)