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Volumn 15, Issue 5, 2009, Pages 763-769

Analysis of the nonlinear dynamic stability for an electrically actuated viscoelastic microbeam

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROSTATICS; GALERKIN METHODS; STABILITY;

EID: 62249174782     PISSN: 09467076     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00542-009-0791-8     Document Type: Article
Times cited : (26)

References (13)
  • 1
    • 33845540121 scopus 로고    scopus 로고
    • The effect of internal stress on the electromechanical buckling of a clamped-clamped beam
    • S Abu-Salih D Elata 2004 The effect of internal stress on the electromechanical buckling of a clamped-clamped beam Proc Eur Micro Nano Syst 2004 93 96
    • (2004) Proc Eur Micro Nano Syst , vol.2004 , pp. 93-96
    • Abu-Salih, S.1    Elata, D.2
  • 2
    • 33845549333 scopus 로고    scopus 로고
    • Experimental validation of electromechanical buckling
    • 6. 10.1109/JMEMS.2006.886015
    • S Abu-Salih D Elata 2006 Experimental validation of electromechanical buckling J Microelectromech Syst 15 6 1656 1662 10.1109/JMEMS.2006.886015
    • (2006) J Microelectromech Syst , vol.15 , pp. 1656-1662
    • Abu-Salih, S.1    Elata, D.2
  • 3
    • 0034275498 scopus 로고    scopus 로고
    • Effects of electrostatic forces generated by the driving signal on capacitive sensing devices
    • 10.1016/S0924-4247(00)00312-5
    • MH Bao H Yang H Yin SQ Shen 2000 Effects of electrostatic forces generated by the driving signal on capacitive sensing devices Sensor Actuator A 84 213 219 10.1016/S0924-4247(00)00312-5
    • (2000) Sensor Actuator A , vol.84 , pp. 213-219
    • Bao, M.H.1    Yang, H.2    Yin, H.3    Shen, S.Q.4
  • 4
    • 0025419444 scopus 로고
    • Creep of sensor's elastic elements: Metals versus non- metals
    • 10.1016/0924-4247(90)87044-J
    • K Bethe D Baumgarten J Frank 1990 Creep of sensor's elastic elements: Metals versus non- metals Sensor Actuator A 21 844 849 10.1016/0924-4247(90) 87044-J
    • (1990) Sensor Actuator A , vol.21 , pp. 844-849
    • Bethe, K.1    Baumgarten, D.2    Frank, J.3
  • 6
    • 4444272849 scopus 로고    scopus 로고
    • Pull-in dynamics of an elastic beam actuated by continuously distributed electrostatic force
    • 10.1115/1.1760559
    • S Krylov R Maimon 2004 Pull-in dynamics of an elastic beam actuated by continuously distributed electrostatic force J Vib Acoust 126 332 342 10.1115/1.1760559
    • (2004) J Vib Acoust , vol.126 , pp. 332-342
    • Krylov, S.1    Maimon, R.2
  • 7
    • 0020269223 scopus 로고
    • A variable parameter incrementation method for dynamic instability of linear and nonlinear elastic systems
    • SL Lau YK Cheung SY Wu 1982 A variable parameter incrementation method for dynamic instability of linear and nonlinear elastic systems J Appl Mech 49 849 853
    • (1982) J Appl Mech , vol.49 , pp. 849-853
    • Lau, S.L.1    Cheung, Y.K.2    Wu, S.Y.3
  • 8
    • 0742286848 scopus 로고    scopus 로고
    • Reliability testing of flexible printed circuit-based RF MEMS capacitive switches
    • 10.1016/j.microrel.2003.09.002
    • S Lee R Ramadoss M Buck VM Bright KC Gupta YC Lee 2004 Reliability testing of flexible printed circuit-based RF MEMS capacitive switches Microelectron Reliab 44 245 250 10.1016/j.microrel.2003.09.002
    • (2004) Microelectron Reliab , vol.44 , pp. 245-250
    • Lee, S.1    Ramadoss, R.2    Buck, M.3    Bright, V.M.4    Gupta, K.C.5    Lee, Y.C.6
  • 9
    • 0031168990 scopus 로고    scopus 로고
    • M-TEST: A test chip for MEMS material property measurement using electrostatically actuated test structures
    • 2. 10.1109/84.585788
    • PM Osterberg SD Senturia 1997 M-TEST: a test chip for MEMS material property measurement using electrostatically actuated test structures J Microelectromech Syst 6 2 107 118 10.1109/84.585788
    • (1997) J Microelectromech Syst , vol.6 , pp. 107-118
    • Osterberg, P.M.1    Senturia, S.D.2
  • 12
    • 0242636509 scopus 로고    scopus 로고
    • A reduced-order model for electrically actuated microbeam-based MEMS
    • 5. 10.1109/JMEMS.2003.818069
    • MI Younis EM Abdel-Rahman AH Nayfeh 2003 A reduced-order model for electrically actuated microbeam-based MEMS J Microelectromech Syst 12 5 672 680 10.1109/JMEMS.2003.818069
    • (2003) J Microelectromech Syst , vol.12 , pp. 672-680
    • Younis, M.I.1    Abdel-Rahman, E.M.2    Nayfeh, A.H.3
  • 13
    • 0242580109 scopus 로고    scopus 로고
    • Electromechanical model of RF MEMS switches
    • 10.1007/s00542-002-0250-2
    • LX Zhang YP Zhao 2003 Electromechanical model of RF MEMS switches Microsyst Technol 9 420 426 10.1007/s00542-002-0250-2
    • (2003) Microsyst Technol , vol.9 , pp. 420-426
    • Zhang, L.X.1    Zhao, Y.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.