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Volumn 517, Issue 10, 2009, Pages 3148-3151

In-situ energy-dispersive X-ray diffraction of metal sulfide assisted crystallization of strongly (001) textured photoactive tungsten disulfide thin films

(3) Brunken, S a Mientus, R b Ellmer, K a

a HAHN MEITNER INSTITUT (Germany)

b Opto Transmitter Umweltschutz Technologie eV (Germany)

Author keywords

Nickel sulfide; Rocking curve; Sulfurization; Tungsten disulfide; X ray diffraction

Indexed keywords

CRYSTALLITES; CRYSTALLIZATION; DIFFRACTION; METALS; NICKEL; NICKEL ALLOYS; PALLADIUM; SCANNING ELECTRON MICROSCOPY; SOLAR ENERGY; SULFUR; THIN FILMS; TUNGSTEN; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

ABSORBER LAYERS; ABSORPTION COEFFICIENTS; ENERGY DISPERSIVE X-RAY DIFFRACTIONS; EUTECTIC TEMPERATURES; IN-SITU; INDIRECT BAND GAPS; METAL FILMS; METAL SULFIDES; NICKEL SULFIDE; PALLADIUM FILMS; PHOTOACTIVITY; RAPID CRYSTALLIZATIONS; ROCKING-CURVE; SULFURIZATION; THIN FILM SOLAR CELLS; TUNGSTEN DISULFIDE; TUNGSTEN DISULPHIDE; TUNGSTEN SULFIDES;

AMORPHOUS FILMS;

EID: 61649088099 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2008.11.118 Document Type: Article

Times cited : (13)

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