The mechanism of nickel sulfide induced rapid crystallization of highly textured tungsten disulfide (WS2) thin films: An in situ real-time diffraction study

Journal of Applied Physics

Volumn 103, Issue 6, 2008, Pages

  Brunken, S ^a   Mientus, R ^b   Seeger, S ^a   Ellmer, K ^a  

^a HAHN MEITNER INSTITUT   (Germany)

^b Optotransmitter Umweltschutz Techn EV   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLIZATION; NICKEL COMPOUNDS; TEXTURES; TRANSMISSION ELECTRON MICROSCOPY; TUNGSTEN COMPOUNDS; X RAY DIFFRACTION;

REAL TIME DIFFRACTION; TUNGSTEN DISULFIDE;

THIN FILMS;

EID: 41549161235     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2875679     Document Type: Article

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