Highly textured films of layered metal disulfide 2H-WS2: Preparation and optoelectronic properties

Journal of the Electrochemical Society

Volumn 144, Issue 3, 1997, Pages 1013-1019

  Matthaus A ^a   Ennaoui, A ^a   Fiechter, S ^a   Tiefenbacher, S ^a   Kiesewetter, T ^a   Diesner, K ^a   Sieber, I ^a   Jaegermann, W ^a   Tsirlina, T ^b   Tenne, R ^b,c  

^a HAHN MEITNER INSTITUT   (Germany)

^b WEIZMANN INSTITUTE OF SCIENCE   (Israel)

^c ELECTROCHEMICAL SOCIETY

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CRYSTAL ORIENTATION; CRYSTALLINE MATERIALS; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY MEASUREMENT; SAPPHIRE; SUBSTRATES; THICK FILMS; ULTRAVIOLET SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

DISULFIDE METALS; HEXAGONAL BASAL PLANES; ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY;

TUNGSTEN COMPOUNDS;

EID: 0343795188     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1837522     Document Type: Article

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