Synthesis of type-II textured tungsten disulfide thin films with bismuth interfacial layer as a texture promoter

Thin Solid Films

Volumn 515, Issue 5, 2007, Pages 2935-2942

  Sadale, S B ^a   Barman, S R ^b   Patil, P S ^a  

^a SHIVAJI UNIVERSITY   (India)

^b UGC DAE CONSORTIUM FOR SCIENTIFIC RESEARCH   (India)

Author keywords

Microstructure; Scanning electron microscopy; Texture; Tungsten disulfide; van der Waals rheotaxy process; X ray photoelectron spectroscopy

Indexed keywords

BISMUTH COMPOUNDS; OXIDATION; SCANNING ELECTRON MICROSCOPY; TEXTURES; TUNGSTEN COMPOUNDS; VAN DER WAALS FORCES; X RAY PHOTOELECTRON SPECTROSCOPY;

CRYSTALLITES; SULFURIZATION; TUNGSTEN DISULFIDE; VAN DER WAALS RHEOTAXY PROCESS;

THIN FILMS;

EID: 33845967508     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.08.042     Document Type: Article

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