-
1
-
-
61549110688
-
-
Feb. 22
-
The Week, vol. 8, no. 349, p. 38, Feb. 22, 2008.
-
(2008)
The Week
, vol.8
, Issue.349
, pp. 38
-
-
-
2
-
-
61549093892
-
-
Package-on-Package (PoP) and Internal Stacked Module (ISM). (Top Package 12 × 22 mm, .65 mm Ball Pitch, ×16F/N Admux, ×16 DRAM Option BA and ×16NAND, ×16 F/D DDR Option BB Multibus.), JESD21-C, MPC3-12-02, JEDEC, Nov. 2007.
-
Package-on-Package (PoP) and Internal Stacked Module (ISM). (Top Package 12 × 22 mm, .65 mm Ball Pitch, ×16F/N Admux, ×16 DRAM Option BA and ×16NAND, ×16 F/D DDR Option BB Multibus.), JESD21-C, MPC3-12-02, JEDEC, Nov. 2007.
-
-
-
-
3
-
-
61549089500
-
-
Fine-Pitch, Square Ball Grid Array (FBGA) Pacfeage-on-Package (PoP), JEDEC Pub. 95, Design Guide 4.22, JEDEC, Nov. 2007, Issue B.
-
Fine-Pitch, Square Ball Grid Array (FBGA) Pacfeage-on-Package (PoP), JEDEC Pub. 95, Design Guide 4.22, JEDEC, Nov. 2007, Issue B.
-
-
-
-
4
-
-
61549105467
-
-
Standard - Internal Stacking Module, Land Grid Array Packages With External Interconnect Terminals (ISM). Item 11.2-699(S), JEDEC Pub. 95, Design Guide 4.21, JEDEC, Mar. 2007.3
-
Standard - Internal Stacking Module, Land Grid Array Packages With External Interconnect Terminals (ISM). Item 11.2-699(S), JEDEC Pub. 95, Design Guide 4.21, JEDEC, Mar. 2007.3
-
-
-
-
5
-
-
35348856825
-
PoP (package-on-package) stacked yield loss study
-
Reno, NV, May
-
K. Ishibashi, "PoP (package-on-package) stacked yield loss study," in Proc 57th IEEE ECTC, Reno, NV, May 2007, pp. 1403-1408.
-
(2007)
Proc 57th IEEE ECTC
, pp. 1403-1408
-
-
Ishibashi, K.1
-
6
-
-
0003589784
-
Moisture/reflow sensitivity classification for nonhermetic solid state surface mounted devices
-
IPC/JEDEC, J-STD-020D, Jun
-
IPC/JEDEC, "Moisture/reflow sensitivity classification for nonhermetic solid state surface mounted devices," J-STD-020D, Jun. 2007.
-
(2007)
-
-
-
7
-
-
61549134363
-
Board level drop test method of components for handheld electronic products
-
JEDEC, Jul
-
JEDEC, "Board level drop test method of components for handheld electronic products," JESD22-B111, Jul. 2003.
-
(2003)
JESD22-B111
-
-
-
9
-
-
51349161848
-
Package on package warpage-Impact on surface mount yields and board level reliability
-
N. Vijayaragavan, F. Carson, and A. Mistri, "Package on package warpage-Impact on surface mount yields and board level reliability," in Proc. 58th IEEE ECTC.
-
Proc. 58th IEEE ECTC
-
-
Vijayaragavan, N.1
Carson, F.2
Mistri, A.3
-
10
-
-
61549137938
-
High temperature package warpage measurement methodology
-
JEDEC, May
-
JEDEC, "High temperature package warpage measurement methodology," JESD22-B112, May 2005.
-
(2005)
JESD22-B112
-
-
-
11
-
-
61549101997
-
Design feature: Packaging stacked memory, Electron
-
Feb. 3
-
D. Sempek, "Design feature: Packaging stacked memory," Electron. Design News, Feb. 3, 2005.
-
(2005)
Design News
-
-
Sempek, D.1
-
12
-
-
35348852546
-
Controlling top package warpage,
-
Reno, NV, May
-
F. Carson, S. M. Lee, and N. Vijayaragavan, "Controlling top package warpage, " in Proc. 57th IEEE ECTC, Reno, NV, May 2007, pp. 737-742.
-
(2007)
Proc. 57th IEEE ECTC
, pp. 737-742
-
-
Carson, F.1
Lee, S.M.2
Vijayaragavan, N.3
-
13
-
-
51349102720
-
The development of the fan-in package-on-package
-
submitted for publication
-
F. Carson, "The development of the fan-in package-on-package," in Proc. 58th IEEE ECTC, submitted for publication.
-
Proc. 58th IEEE ECTC
-
-
Carson, F.1
-
14
-
-
35348829738
-
Flip chip package-in-package (fcPiP): A new 3D packaging solution for mobile platforms
-
Reno, NV, May
-
R. Pendse et al., "Flip chip package-in-package (fcPiP): A new 3D packaging solution for mobile platforms," in Proc 57th IEEE ECTC, Reno, NV, May 2007, pp. 1425-1430.
-
(2007)
Proc 57th IEEE ECTC
, pp. 1425-1430
-
-
Pendse, R.1
|