Fluorescence X-ray absorption spectroscopy using a Ge pixel array detector: Application to high-temperature superconducting thin-film single crystals

Journal of Synchrotron Radiation

Volumn 13, Issue 4, 2006, Pages 314-320

  Oyanagi, H ^a   Tsukada, A ^b,g   Naito, M ^b,g   Saini, N L ^c   Lampert, M O ^d   Gutknecht, D ^d   Dressler, P ^d   Ogawa, S ^e   Kasai, K ^f   Mohamed, S ^a,h   Fukano, A ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b Kashino Diverse Brain Research Laboratory of NTT Communication Science Laboratories   (Japan)

^c SAPIENZA UNIVERSITY OF ROME   (Italy)

^d Canberra Eurisys SA   (France)

^e Ogawa Consulting Engineer's Office   (Japan)

^f NE Software ^*  (Japan)

^g TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY   (Japan)

^h NAGOYA UNIVERSITY   (Japan)

Author keywords

Fluorescence XAS; High temperature superconductivity; Pixel array detector; Thin film single crystals

Indexed keywords

CRYSTAL STRUCTURE; DATA REDUCTION; DETECTORS; DIFFRACTION; FLUORESCENCE; HIGH TEMPERATURE APPLICATIONS; MOLECULAR BEAM EPITAXY; SINGLE CRYSTALS; THIN FILMS;

FLUORESCENCE XAS; HIGH-TEMPERATURE SUPERCONDUCTIVITY; PIXEL ARRAY DETECTOR; THIN-FILM SINGLE CRYSTALS;

ABSORPTION SPECTROSCOPY;

GERMANIUM;

ALGORITHM; ARTICLE; ARTIFICIAL MEMBRANE; CHEMISTRY; CONFORMATION; CRYSTALLOGRAPHY; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; LIQUID CRYSTAL; METHODOLOGY; RADIATION EXPOSURE; SIGNAL PROCESSING; SPECTROMETRY; TEMPERATURE; X RAY;

ALGORITHMS; CRYSTALLOGRAPHY; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; GERMANIUM; LIQUID CRYSTALS; MEMBRANES, ARTIFICIAL; MOLECULAR CONFORMATION; SIGNAL PROCESSING, COMPUTER-ASSISTED; SPECTROMETRY, X-RAY EMISSION; TEMPERATURE; X-RAYS;

EID: 33748189868     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049506015251     Document Type: Article

References (22)

1. Bianconi, A., Saini, N. L., Lanzara, A., Missori, M., Rossetti, T., Oyanagi, H., Yamaguchi, H., Oka, K. & Ito, T. (1996). Phys. Rev. Lett. 76, 3412-3415.
2. Bozoic, I., Logvenov, G., Belca, I., Narimbetov, B. & Sveklo, I. (2002). Phys. Rev. Lett. 89, 107001-1-3.
3. Choi, K. J., Biegalski, M., Li, Y. L., Sharan, A., Schubert, J., Uecker, R., Reiche, P., Chen, Y. B., Pan, X. Q., Gopalan, V., Chen, L.-Q., Schlom, D. G. & Eom, C. B. (2004). Science, 306, 105-108.
4. Cramer, S. P., Tench, O., Yocum, M. & George, G. N. (1988). Nucl. Instrum. Methods, A266, 586.
5. Farrow, R., Derbyshire, G. E., Dobson, B. R., Dent, A. J., Bogg, D., Headspith, J., Lawton, R., Martini, M., Buxton, K. & Trammel, R. (1994). Physica B, 208/209, 256-258.
6. Gao, L., Xue, Y. Y., Chen, F., Xiong, Q., Meng, R. L., Ramirez, D., Chu, C. W., Eggert, J. H. & Mao, H. K. (1994). Phys. Rev. B, 50, 4260-4263.
7. Heald, S. M., Keller, E. & Stern, E. A. (1984). Phys. Lett. 103A, 155-158.
8. Khasanov, R., Eshchenko, D. G., Luetkens, H., Morenzoni, E., Prokscha, T., Suter, A., Garifianov, N., Mali, M., Roos, J., Conder, K. & Keller, H. (2004). Phys. Rev. Lett. 92, 057602-1-4.
9. Lanzara, A., Bogdanov, P. V., Zhou, X. J., Keller, S. A., Feng, D. L., Lu, E. D., Yoshida, T., Eisaki, H., Fujimori, A., Kishio, K., Shimoyama, J.-I., Noda, T., Uchida, S., Hussain, Z. & Shen, Z.-X. (2001). Nature (London), 412, 510-514.
10. Locquet, J.-P., Perret, J., Fompeyrine, J., Machler, E., Seo, J. W. & Van Tendeloo, G. (1998). Nature (London), 394, 453-456.
11. Naito, M. & Sato, H. (1995). Appl. Phys. Lett. 67, 2557-2559.
12. Oyanagi, H. (1998). J. Synchrotron Rad. 5, 48-53.
13. Oyanagi, H., Fonne, C., Gutknecht, D., Dressler, P, Henck, R., Lampert, M.-O., Ogawa, S. & Kasai, K. (2002). Nucl. Instrum. Methods, A513, 340-344.
14. Oyanagi, H., Haga, K. & Kuwahara, Y. (1996). Rev. Sci. Instrum. 67, 350-354.
15. Oyanagi, H., Martini, M. & Saito, M. (1998). Nucl. Instrum. Methods, A403, 58-64.
16. Oyanagi, H., Shioda, R., Kuwahara, Y & Haga, K. (1995). J. Synchrotron Rad. 2, 99-105.
17. Radaelli, P. G., Hinks, D. G., Mitchell, A. W., Hunter, B. A., Wagner, J. L., Dabrowski, B., Vandervoort, K. G., Viswanathan, H. K. & Jorgensen, J. D. (1994). Phys. Rev. B, 49, 4163-4175.
18. Rehr, J., Zabrinsky, S. I. & Albers, R. C. (1992). Phys. Rev. Lett. 69, 3397-3400.
19. Saini, N. L., Lanzara, A., Oyanagi, H., Yamaguchi, H., Oka, K., Itoo, T. & Bianconi, A. (1997). Phys. Rev. B, 55, 12759-12769.
20. Sato, H. & Naito, M. H. (1997). Physica C, 280, 178-186.
21. Tsukada, A., Greibe, T. & Naito, M. (2002). Phys. Rev. B, 66, 184515-1-5.
22. Warburton, W. et al. (1996). Proceedings of the 9th International Conference on X-ray Absorption Fine Structure, Grenoble, France.