A bent Laue analyzer for fluorescence EXAFS detection

Journal of Synchrotron Radiation

Volumn 6, Issue 3, 1999, Pages 212-214

  Zhong, Zhong ^a   Chapman, Dean ^b   Bunker, Bruce ^c   Bunker, Grant ^b   Fischetti, Robert ^b   Segre, Carlo ^b  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b ILLINOIS INSTITUTE OF TECHNOLOGY   (United States)

^c UNIVERSITY OF NOTRE DAME   (United States)

Author keywords

Bent crystal; Crystal analyzer; Fluorescence detector

Indexed keywords

EID: 0033466248     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049599002022     Document Type: Article

References (5)

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5. Zhong. Z., Chapman D., Thomlinson W., Arfelli F. & Menk R. (1997). Nucl. Instrum. Meth. in Phys. Res. A. 399, 489-498.