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Volumn 472, Issue 1-2, 2009, Pages 281-285

Synthesis and characterization of Sn-3.5Ag-XZn alloy nanoparticles by the chemical reduction method

Author keywords

Alloy; Nanoparticles; Transmission electron microscopy; X ray diffraction

Indexed keywords

DIFFRACTION GRATINGS; DIFFRACTION PATTERNS; ELECTRON MICROSCOPES; ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; HOLOGRAPHIC INTERFEROMETRY; INTERMETALLICS; NANOPARTICLES; PARTICLE SIZE; PRECIPITATION (CHEMICAL); SCANNING ELECTRON MICROSCOPY; SILVER ALLOYS; SYNTHESIS (CHEMICAL); TIN; TIN ALLOYS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZINC; ZINC ALLOYS;

EID: 61349148783     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2008.04.063     Document Type: Article
Times cited : (18)

References (33)
  • 13
    • 61349101567 scopus 로고    scopus 로고
    • US Patent 420,557,420/562 June 9, 1998
    • S. Jin, M.C. Mc Cormack, US Patent 420,557,420/562 (June 9, 1998).
    • Jin, S.1    Mc Cormack, M.C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.