Structural and electrical properties of SrBi2(Ta0.5Nb0.5)2 O9 thin films

Journal of Alloys and Compounds

Volumn 458, Issue 1-2, 2008, Pages 500-503

  Amsei Junior N L ^a   Simoes A Z ^a   Pianno, R F C ^a   Zanetti, S M ^b   Longo, E ^a   Varela, J A ^a  

^a SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

^b INSTITUTO NACIONAL DE PESQUISAS ESPACIAIS   (Brazil)

Author keywords

Chemical synthesis; Ferroelectric; Nanostructures; Thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; ELECTRIC PROPERTIES; POLYMERS; SCANNING ELECTRON MICROSCOPY; STRONTIUM COMPOUNDS; STRUCTURAL PROPERTIES; X RAY DIFFRACTION;

CRYSTALLINITY; FIELD EMISSION SCANNING ELECTRON MICROSCOPY (FEG-SEM); POLYMERIC PRECURSOR METHOD; STATIC AIR;

THIN FILMS;

EID: 43349103651     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2007.04.039     Document Type: Article

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