Structure and morphology of Cu/Ni film grown by electrodeposition method: A study of neutron reflectivity and AFM

Applied Surface Science

Volumn 255, Issue 11, 2009, Pages 5910-5916

  Singh, Surendra ^a   Basu, Saibal ^a   Ghosh, S K ^a  

^a BHABHA ATOMIC RESEARCH CENTRE   (India)

Author keywords

AFM; Electrodeposition; Morphology; Neutron reflectometry

Indexed keywords

ATOMIC FORCE MICROSCOPY; CORROSION; ELECTRODEPOSITION; ELECTRODES; FILM GROWTH; METALLIC FILMS; MORPHOLOGY; NEUTRONS; REFLECTION; SURFACE STRUCTURE; X RAY DIFFRACTION;

CRYSTALLINE STRUCTURE; ELECTRODEPOSITION METHODS; INTERFACE MORPHOLOGIES; NEUTRON REFLECTOMETRY; POLYCRYSTALLINE GROWTH; SPECULAR NEUTRON REFLECTIVITIES; STRUCTURE AND MORPHOLOGY; X-RAY AND NEUTRON REFLECTIVITY;

INTERFACES (MATERIALS);

EID: 60949101441     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.01.030     Document Type: Article

References (35)

1. Rossnagel S.M., Sherman A., and Turner F. J. Vac. Sci. Technol. B 18 (2000) 2016
2. Baibich M.N., Broto J.M., Fert A., Nguyen Van Dau F., Petro F., Eitenne P., Creuzet G., Friederich A., and Chazelas J. Phys. Rev. Lett. 61 (1988) 2472
3. Naik R., Poli A., McKague D., Lukaszew A., and Wenger L.E. Phys. Rev. B 51 (1995) 3549
4. Han J.H., Yang W.S., Yoo J.B., and Park C.Y. J. Appl. Phys. 88 (2000) 7363
5. Choi Y.C., Shin Y.M., Lee Y.H., Lee B.S., Park G.S., Choi W.B., Lee N.S., and Kim J.M. Appl. Phys. Lett. 76 (2000) 2367
6. Shin Y.M., Jeong S.Y., Jeong H.J., Eum S.J., Yang C.W., Park C.Y., and Lee Y.H. J. Crystal Growth 271 (2004) 81
7. Bakonyi I., Tóth J., Goualou L., Becsei T., Tóth-Kádár E., Schwarzacher W., and Nabiyouni G. J. Electrochem. Soc. 149 (2002) C195
8. Meuleman W.R.A., Roy S., Péter L., and Varga I. J. Electrochem. Soc. 149 (2002) C479
9. Chassaing E., Morrone A., and Schmidt J.E. J. Electrochem. Soc. 146 (1999) 1794
10. Weihnacht V., Péter L., Tóth J., Pádár J., Kerner Zs., Schneider C.M., and Bakonyi I. J. Electrochem. Soc. 150 (2003) C507
11. Ghosh S.K., Choudhury P., Gupta S.K., Ravikumar G., Kumar M.S., Aswal D.K., Dusane R.O., and Grover A.K. Appl. Phys. Lett. 89 (2006) 132507
12. Pardo J., Megademini T., and Andre J.M. Rev. Phys. Appl. 23 (1988) 1579
13. Sinha S.K., Sirota E.B., Garoff S., and Stanley H.B. Phys. Rev. B 38 (1988) 2297
14. Holý V., and Baumbach T. Phys. Rev. B 49 (1994) 10668
15. Schlomka J.P., Tolan M., Schwalowsky L., Seeck O.H., Stettner J., and Press W. Phys. Rev. B 51 (1995) 2311
16. Singh S., and Basu S. Surf. Sci. 600 (2006) 493
17. Singh S., Ghosh S.K., Basu S., Gupta M., Mishra P., and Grover A.K. Electrochem. Solid-State Lett. 9 (2006) J5
18. Basu S., and Singh S. J. Neutron Res. 44 2 (2006) 109
19. Scharifker B., and Hills G. Electrochem. Acta 28 (1983) 879
20. Hope S., Lee J., Rosenbusch P., Lauhoff G., Bland J.A.C., Ercole A., Bucknall D., Penfold J., Lauter H.J., Lauter V., and Cubitt R. Phys. Rev. B 55 (1997) 11422
21. Hollanders M.A., Thijsse B.J., and Mittemeijer E.J. Phys. Rev. B 42 (1990) 5481
22. Daillant J., and Gibaud A. X-ray and Neutron Reflectivity: Principles and Applications (1999), Springer, Berlin
23. Majkrzak C.F. Physica B 173 (1991) 75
24. Wormington M., Pape I., Hase T.P.A., Tanner B.K., and bowen D.K. Philos. Mag. Lett. 74 (1996) 211
25. Holý V., Kubena J., Ohlídal I., Lischka K., and Plotz W. Phys. Rev. B 47 (1993) 15896
26. Mandelbrot B.B. The Fractal Geometry of Nature (1982), Freeman, New York
27. Vignaud G., Gibaud A., Wang J., Sinha S.K., Daillant J., Grubel G., and Gallot Y. J. Phys.: Condens. Matter. 9 (1997) L125
28. Zhao Y.P., Cheng C.F., Wang G.C., and Lu T.M. Appl. Phys. Lett. 73 (1998) 2432
29. Yang H.-N., Wang G.-C., and Lu T.-M. Phys. Rev. B 51 (1995) 17932
30. Fang S.J., Haplepete S., Chen W., Helms C.R., and Edwards H. J. Appl. Phys. 82 (1997) 5891
31. Kiely J.D., and Bonnell D.A. J. Vac. Sci. Technol. B 15 4 (1997) 1483
32. Schwarzacher W. J. Phys.: Condens. Matter. (2004) 859
33. Yoshinobu T., Iwamoto A., and Iwasaki H. Jpn. J. Appl. Phys., Part 1 33 (1994) L67
34. Palasantzas G., and Krim J. Phys. Rev. Lett. 73 (1994) 3564
35. Koltover I., Salditt T., Rigaud J.-L., and Safinya C.R. Phys. Rev. Lett. 81 (1998) 2494