Thermoelectric properties of ternary and Al-containing quaternary Ru1-xRexSiy chimney-ladder compounds

Acta Materialia

Volumn 57, Issue 6, 2009, Pages 2010-2019

  Kishida, Kyosuke ^a   Ishida, Akira ^a   Koyama, Tatsuya ^a   Harada, Shunta ^a   Okamoto, Norihiko L ^a   Tanaka, Katsushi ^a   Inui, Haruyuki ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

Crystal structure; Electron diffraction; Semiconductor compounds; Thermoelectric; Transition metal silicides

Indexed keywords

ALUMINUM; CARRIER CONCENTRATION; CHEMICAL ANALYSIS; CHIMNEYS; CONCENTRATION (PROCESS); ELECTRIC CONDUCTIVITY; ELECTRIC RESISTANCE; ELECTRON DIFFRACTION; LADDERS; REAL TIME SYSTEMS; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR MATERIALS; SILICIDES; SILICON; SILICON ALLOYS; THERMOELECTRIC EQUIPMENT; TRANSITION METAL COMPOUNDS; TRANSITION METALS;

ABSOLUTE VALUES; ALLOY COMPOSITIONS; ATOMIC PACKINGS; DIMENSIONLESS FIGURE OF MERITS; DIRECTIONALLY SOLIDIFIED ALLOYS; ELECTRICAL RESISTIVITIES; LADDER COMPOUNDS; P TYPES; QUATERNARY ALLOYS; SEMICONDUCTING BEHAVIORS; SEMICONDUCTOR COMPOUNDS; THERMOELECTRIC; THERMOELECTRIC PROPERTIES; TRANSITION METAL SILICIDES; VALENCE ELECTRON CONCENTRATIONS;

CRYSTAL STRUCTURE;

EID: 60849092241     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2008.12.039     Document Type: Article

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