Formation of a series of chimney-ladder compounds in the Ru-Re-Si system

Acta Materialia

Volumn 54, Issue 10, 2006, Pages 2857-2865

  Simkin, B A ^a   Ishida, A ^a   Okamoto, N L ^a   Kishida, K ^a   Tanaka, K ^a   Inui, H ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

Crystal structure; Electron diffraction; Semiconductor compounds; Transition metal silicides; Transmission electron microscopy

Indexed keywords

CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; TRANSMISSION ELECTRON MICROSCOPY; X RAY POWDER DIFFRACTION;

CHIMNEY-LADDER COMPOUNDS; MONOSILICIDE; TRANSITION METAL SILICIDES;

RUTHENIUM ALLOYS;

EID: 33646497219     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2006.02.022     Document Type: Article

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