Principal component analysis of TOF-SIMS spectra, images and depth profiles: An industrial perspective

Applied Surface Science

Volumn 231-232, Issue , 2004, Pages 235-239

  Pacholski, Michaeleen L ^a  

^a ROHM AND HAAS COMPANY   (United States)

Author keywords

Chemometrics; Multivariate; PCA

Indexed keywords

ADHESIVES; ELECTRONIC EQUIPMENT; GAS CHROMATOGRAPHY; ION EXCHANGE RESINS; LIQUID CHROMATOGRAPHY; PRINCIPAL COMPONENT ANALYSIS; SECONDARY ION MASS SPECTROMETRY; SPECTRUM ANALYSIS;

CHEMOMETRICS; DATASETS; MASS CALIBRATION; MULTIVARIATE;

SURFACE PROPERTIES;

EID: 2942585208     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.03.023     Document Type: Conference Paper

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