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Volumn 5, Issue 6, 2008, Pages 1502-1504
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Structural properties of aluminum nitride bulk single crystals grown by PVT
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Author keywords
[No Author keywords available]
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Indexed keywords
ALN;
ALN BULK CRYSTAL;
BULK ALN;
BULK SINGLE CRYSTALS;
DEFECT ANALYSIS;
GROWTH OPTIMIZATION;
LOW ANGLE GRAIN BOUNDARIES;
LOWER DENSITY;
MEAN DENSITY;
MOSAIC STRUCTURE;
MOSAICITY;
OPTICAL HOMOGENEITY;
OPTIMIZED CONDITIONS;
STRUCTURAL QUALITIES;
THREADING DISLOCATION;
VAPOUR TRANSPORT;
WET-CHEMICAL ETCHING;
X RAY ROCKING CURVE;
ALUMINUM NITRIDE;
DISLOCATIONS (CRYSTALS);
GRAIN BOUNDARIES;
GRAIN GROWTH;
NITRIDES;
OPTIMIZATION;
SEMICONDUCTOR GROWTH;
SILICON CARBIDE;
WET ETCHING;
SINGLE CRYSTALS;
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EID: 59349089477
PISSN: 18626351
EISSN: 16101642
Source Type: Journal
DOI: 10.1002/pssc.200778422 Document Type: Conference Paper |
Times cited : (39)
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References (10)
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