A high-energy triple-axis X-ray diffractometer for the study of the structure of bulk crystals

Journal of Applied Crystallography

Volumn 37, Issue 6, 2004, Pages 901-910

  Seitz, C ^a   Weisser, M ^a   Gomm, M ^a   Hock, R ^a   Mager, A ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON; TUNGSTEN;

ANALYZER; ARTICLE; BULK CRYSTAL; CRYSTAL STRUCTURE; CRYSTALLIZATION; CRYSTALLOGRAPHY; CZOCHRALSKI GROWTH; FULL WIDTH AT HALF MAXIMUM VALUE; GEOMETRY; HIGH ENERGY TRIPLE AXIS X RAY DIFFRACTOMETER; HIGH ENERGY X RAY; INSTRUMENT; LAUE GEOMETRY; MONOCHROMATOR; OPTICAL RESOLUTION; OPTICS; REFLECTIVITY; SAMPLE SIZE; X RAY; X RAY TUBE;

EID: 10344243468     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889804023805     Document Type: Article

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