SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 517, Issue 8, 2009, Pages 2590-2595

Stress-corrosion cracking of indium tin oxide coated polyethylene terephthalate for flexible optoelectronic devices

(4) Sierros, Konstantinos A a Morris, Nicholas J a Ramji, Karpagavalli a Cairns, Darran R a

a West Virginia University (United States)

Author keywords

Flexible optoelectronic devices; Indium tin oxide; Stress corrosion

Indexed keywords

ACIDS; ADHESIVES; CARBOXYLIC ACIDS; COMPOSITE FILMS; CONDUCTING POLYMERS; CRACKING (CHEMICAL); ELECTROOPTICAL DEVICES; INDIUM; OPTOELECTRONIC DEVICES; ORGANIC ACIDS; PHOTOLITHOGRAPHY; POLYESTERS; POLYETHYLENE TEREPHTHALATES; POLYETHYLENES; POSITRON EMISSION TOMOGRAPHY; RESIDUAL STRESSES; STRESS CORROSION CRACKING; STRESSES; TENSILE STRAIN; TENSILE STRENGTH; THERMOPLASTICS; TIN; TITANIUM COMPOUNDS;

ACRYLIC ACIDS; APPLIED MECHANICAL STRESS; COMBINED EFFECTS; CONDUCTIVE POLYMERS; CORROSIVE ENVIRONMENTS; FLEXIBLE DEVICES; FLEXIBLE OPTOELECTRONIC DEVICES; INDIUM TIN OXIDE; MECHANICAL STRESS; PET COMPOSITES; PRESSURE-SENSITIVE ADHESIVES; STRESS CORROSION; STRESS-CORROSION CRACKINGS; TEREPHTHALATES; TIME TO FAILURES; TRANSPARENT CONDUCTIVE LAYERS;

CORROSION;

EID: 59249099506 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2008.10.031 Document Type: Article

Times cited : (138)

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