Characterization of indium-tin-oxide films with improved corrosion resistance

Surface and Interface Analysis

Volumn 37, Issue 4, 2005, Pages 385-392

  Gaarenstroom, Stephen W ^a   Balogh, Michael P ^a   Militello, Maria C ^a   Waldo, Richard A ^a   Wong, Curtis A ^a   Kelly, Nelson A ^a   Gibson, Thomas L ^a   Kundrat, Matthew D ^b  

^a GENERAL MOTORS CORPORATION   (United States)

^b USA   (United States)

Author keywords

Corrosion; EIS; EMPA; ITO; SEM; Solar cell; XPS; XRD

Indexed keywords

AMORPHOUS SILICON; COATING TECHNIQUES; COMPOSITION; CORROSION RESISTANCE; SCANNING ELECTRON MICROSCOPY; SOLAR CELLS; SPUTTER DEPOSITION; TEXTURES; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

CORROSION RATES; EIS; EMPA; ITO;

INDIUM COMPOUNDS;

EID: 17044377595     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.2010     Document Type: Conference Paper

References (10)

1. Bak T, Nowotny J, Rekas M, Sorrell CC. Int. J. Hydrogen Energy 2002; 27: 991.
2. Khaselev O, Bansal A, Turner JA. Int. J. Hydrogen Energy 2001; 26: 127.
3. Rocheleau RE, Miller EL, Misra A. Energy Fuels 1998; 12: 3.
4. Yamada Y, Matsuki N, Ohmori T, Mametsuka H, Kondo M, Matsuda A, Suzuki E. Int. J. Hydrogen Energy 2003; 28: 1167.
5. Lewis BG, Paine DC. MRS Bull. 2000; 25: 22.
6. Deng X, Miller G, Wang R, Xu L, Compaan AD. In Proc. Second World Conference and Exhibition on Photovoltaic Solar Energy Conversion and 27th IEEE Photovoltaic Specialist Conference. IEEE: 1998; 700.
7. Waldo RA. In Microbeam Analysis - 1988, Newbury D (ed.). San Francisco Press: San Francisco, 1988; 310.
8. Powder Diffraction File, Release 1999. International Centre for Diffraction Data: Newton Square PA, 1999.
9. Miller E, Rocheleau R. In Proc. of the 2000 Hydrogen Program Review, NREL/CP-570-28890. US Dept. of Energy National Renewable Energy Laboratory: 2000.
10. Wu W-F, Chiou B-S. Semicond. Sci. Technol. 1996; 11: 196.