Single-event data analysis

IEEE Transactions on Nuclear Science

Volumn 55, Issue 6, 2008, Pages 2819-2841

  Petersen, E L ^a  

^a NONE

Author keywords

Single event effect (SEE); Single event upset (SEU)

Indexed keywords

DOSIMETERS; DOSIMETRY; ELECTRIC NETWORK ANALYSIS; ENERGY TRANSFER; ERRORS; LIGHTING FIXTURES; PROBABILITY DENSITY FUNCTION; RANDOM ERRORS; SECONDARY EMISSION; URANIUM POWDER METALLURGY; WEIBULL DISTRIBUTION;

CROSS SECTIONS; CROSS-SECTION VALUES; DATA ACCUMULATIONS; DATA ANALYSIS; DATA CONSISTENCIES; EXPECTED VALUES; LINEAR ENERGY TRANSFERS; LOG-NORMAL FUNCTIONS; SINGLE-EVENT EFFECT (SEE); SINGLE-EVENT UPSET (SEU); STANDARD DEVIATIONS; UPSET RATES; WEIBULL FUNCTIONS;

SYSTEMATIC ERRORS;

EID: 58849120534     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2008.2007903     Document Type: Conference Paper

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