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Volumn 86, Issue 12, 2008, Pages 1401-1407

Determining the sp2/sp3 bonding concentrations of carbon films using X-ray absorption spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; ABSORPTION SPECTROSCOPY; AMORPHOUS CARBON; AMORPHOUS FILMS; AMORPHOUS SILICON; DIAMONDS; DOPING (ADDITIVES); ELECTRODEPOSITION; ELECTROMAGNETIC WAVE ABSORPTION; ENERGY ABSORPTION; GAS ABSORPTION; METHANATION; METHANE; MICROWAVES; NITROGEN; NONMETALS; PLASMA DEPOSITION; SUBSTRATES; X RAY ABSORPTION; X RAY SPECTROSCOPY;

EID: 58449123836     PISSN: 00084204     EISSN: None     Source Type: Journal    
DOI: 10.1139/P08-063     Document Type: Article
Times cited : (3)

References (53)
  • 18
    • 58449108175 scopus 로고    scopus 로고
    • Origin [computer program, Available from
    • Origin [computer program]. Available from http://www.originlab.com/.
  • 25
    • 58449115893 scopus 로고    scopus 로고
    • J. Stöhr. NEXAFS Spectroscopy. 25. Springer, New York, USA. 1996.
    • J. Stöhr. NEXAFS Spectroscopy. Vol. 25. Springer, New York, USA. 1996.
  • 27
    • 0004932883 scopus 로고    scopus 로고
    • B.L. Henke, E.M. Gullikson, and J.C. Davis. At. DataNucl. Data Tables, 54, 181 (1993).
    • B.L. Henke, E.M. Gullikson, and J.C. Davis. At. DataNucl. Data Tables, 54, 181 (1993).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.