Growth dynamics of C60 thin films: Effect of molecular structure

Applied Physics Letters

Volumn 94, Issue 2, 2009, Pages

  Yim, S ^a   Jones, T S ^b  

^a Kookmin University   (South Korea)

^b UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; CRYSTAL GROWTH; FILM GROWTH; FULLERENES; GRAIN BOUNDARIES; MOLECULAR STRUCTURE; QUANTUM CHEMISTRY; SEMICONDUCTING INDIUM; SEMICONDUCTING ORGANIC COMPOUNDS; SEMICONDUCTOR GROWTH; SEMICONDUCTOR MATERIALS; SURFACE DIFFUSION; THIN FILMS;

ATOMIC FORCES; C60 THIN FILMS; CORRELATION FUNCTIONS; DO-MAINS; FILM MATERIALS; FULLERENE THIN FILMS; GROWTH BEHAVIORS; GROWTH DYNAMICS; GROWTH EXPONENTS; LATERAL DIFFUSIONS; ORGANIC SEMICONDUCTORS; ORGANIC THIN FILMS;

GROWTH (MATERIALS);

EID: 58349106930     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3072805     Document Type: Article

References (21)

1. S. R. Forrest, Chem. Rev. (Washington, D.C.) 0009-2665 10.1021/cr941014o 97, 1793 (1997).
2. D. J. Gundlach, Y. Y. Lin, T. N. Jackson, S. F. Nelson, and D. G. Schlom, IEEE Electron Device Lett. 0741-3106 10.1109/55.556089 18, 87 (1997).
3. S. Yim and T. S. Jones, Phys. Rev. B 0163-1829 10.1103/PhysRevB.73.161305 73, 161305 (2006).
4. S. Kowarik, A. Gerlach, and F. Schreiber, J. Phys.: Condens. Matter 0953-8984 10.1088/0953-8984/20/18/184005 20, 184005 (2008).
5. A. C. Dürr, F. Schreiber, K. A. Ritley, V. Kruppa, J. Krug, H. Dosch, and B. Struth, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.90.016104 90, 016104 (2003).
6. G. W. Collins, S. A. Letts, E. M. Fearon, R. L. McEachern, and T. P. Bernat, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.73.708 73, 708 (1994).
7. S. Yim K. -I Kim, and T. S. Jones, J. Phys. Chem. C 1932-7447 10.1021/jp0715272 111, 10993 (2007).
8. J. Krug, Adv. Phys. 0001-8732 10.1080/00018739700101498 46, 139 (1997).
9. J. H. Jeffries, J. -K. Zuo, and M. M. Craig, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.76.4931 76, 4931 (1996).
10. S. Huo and W. Schwarzacher, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.86.256 86, 256 (2001).
11. J. M. Lopez, M. Castro, and R. Gallego, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.94.166103 94, 166103 (2005).
12. A. L. Barabasi and H. E. Stanley, Fractal Concepts in Surface Growth (Cambridge University Press, Cambridge, 1995).
13. J. Krug, Physica A 0378-4371 10.1016/j.physa.2004.05.027 340, 647 (2004).
14. Y. -P. Zhao, J. B. Fortin, G. Bonvallet, G. -C. Wang, and T. -M. Lu, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.85.3229 85, 3229 (2000).
15. G. Palasantzas and J. Krim, Phys. Rev. B 0163-1829 10.1103/PhysRevB.48. 2873 48, 2873 (1993).
16. V. Hol, U. Pietsch, and T. Baumbach, High-Resolution X-Ray Scattering From Thin Films and Multilayers (Springer, Berlin, 1999).
17. S. Kowarik, A. Gerlach, S. Sellner, F. Schreiber, J. Pflaum, L. Cavalcanti, and O. Konovalov, Phys. Chem. Chem. Phys. 1463-9076 10.1039/b517866e 8, 1834 (2006).
18. T. -W. Huang, H. -Y. Lee, Y. -W. Hsieh, and C. -H. Lee, J. Cryst. Growth 0022-0248 10.1016/S0022-0248(01)01950-9 237, 492 (2002).
19. J. T. Sadowski, R. Z. Bakhtizin, A. I. Oreshkin, T. Nishihara, A. Al-Mahboob, Y. Fujikawa, K. Nakajima, and T. Sakurai, Surf. Sci. Lett. 601, L136 (2007). 0167-2584
20. W. W. Pai and C-L. Hsu, Phys. Rev. B 68, 121403 (2003).
21. P. Reinke, H. Feldermann, and P. Oelhafen, J. Chem. Phys. 0021-9606 10.1063/1.1625914 119, 12547 (2003).