Surface sensitivity in cluster-ion-induced sputtering

Physical Review Letters

Volumn 96, Issue 21, 2006, Pages

  Szakal, Christopher ^a   Kozole, Joseph ^a   Russo, Michael F ^a   Garrison, Barbara J ^a   Winograd, Nicholas ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ENERGY DISSIPATION; MOLECULAR DYNAMICS; SECONDARY ION MASS SPECTROMETRY; SURFACE PROPERTIES;

MOLECULAR DYNAMICS COMPUTER SIMULATIONS; SURFACE SENSITIVITY; WATER MOLECULES;

SPUTTERING;

EID: 33744806368     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.96.216104     Document Type: Article

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