![]() |
Volumn 41, Issue 21, 2008, Pages
|
Refinement of Monte Carlo simulations of electron-specimen interaction in low-voltage SEM
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ATOMS;
ELECTRIC FIELDS;
ELECTROMAGNETIC FIELDS;
ELECTRON SCATTERING;
ELECTRONS;
EMISSION SPECTROSCOPY;
EXPERIMENTS;
FLOW INTERACTIONS;
IMAGE ENHANCEMENT;
MODELS;
MONTE CARLO METHODS;
SCANNING ELECTRON MICROSCOPY;
SCATTERING;
SPONTANEOUS EMISSION;
BACKSCATTERED ELECTRONS;
DETAILED MODELS;
DIELECTRIC FUNCTIONS;
IN BUILDINGS;
LOW VOLTAGES;
MONTE CARLO;
MONTE CARLO SIMULATIONS;
PHYSICAL MODELS;
SCANNING ELECTRON MICROSCOPES;
SECONDARY ELECTRONS;
SEM IMAGES;
SEM IMAGING;
SIMULATION PACKAGES;
SIMULATION RESULTS;
ELECTRON ENERGY LOSS SPECTROSCOPY;
|
EID: 58149311228
PISSN: 00223727
EISSN: 13616463
Source Type: Journal
DOI: 10.1088/0022-3727/41/21/215310 Document Type: Article |
Times cited : (94)
|
References (41)
|