Experimental secondary electron spectra under SEM conditions

Journal of Microscopy

Volumn 215, Issue 1, 2004, Pages 77-85

  Joy, D C ^a,b   Prasad, M S ^a   Meyer III, H M ^b  

^a UNIVERSITY OF TENNESSEE   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Electron spectroscopy; Microanalysis; Secondary electrons

Indexed keywords

ELECTRON PROBE MICROANALYSIS; ELECTRON SPECTROSCOPY; ELECTRONS; SECONDARY EMISSION;

CONDITION; ELECTRON SPECTRUM; ENERGY; PURE ELEMENTS; SCANNING ELECTRONS; SCANNING MICROSCOPY; SECONDARY ELECTRON EMISSIONS; SECONDARY ELECTRONS; SPECTRA'S; SURFACE CONTAMINATIONS;

SCANNING ELECTRON MICROSCOPY;

ARTICLE; ELECTRON; ENERGY; EXPERIMENT; PRIORITY JOURNAL; REPRODUCIBILITY; SCANNING ELECTRON MICROSCOPE; SCANNING ELECTRON MICROSCOPY; SPECTRUM; SURFACE PROPERTY;

EID: 3042680937     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.0022-2720.2004.01345.x     Document Type: Article

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