System modelling of a lateral force microscope

Nanotechnology

Volumn 19, Issue 45, 2008, Pages

  Michal, Guillaume ^a   Lu, Cheng ^a   Kiet Tieu, A ^a  

^a UNIVERSITY OF WOLLONGONG   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

CONSTITUTIVE EQUATIONS; CROSSTALK; FINITE ELEMENT METHOD; NANOCANTILEVERS; SULFUR COMPOUNDS; TORSIONAL STRESS;

ANALYTICAL EQUATIONS; FINITE ELEMENT ANALYSIS; FIRST ORDERS; LATERAL FORCE MICROSCOPES; OPTICAL MODELS; OPTICAL-; PHOTODIODE SIGNALS; SINGLE RAYS; TIP APICES;

MODAL ANALYSIS;

ANALYTIC METHOD; ARTICLE; CHEMICAL FORCE MICROSCOPY; CONTROLLED STUDY; EXPERIMENTAL MODEL; FINITE ELEMENT ANALYSIS; LASER; MICROSCOPE; PRIORITY JOURNAL; SENSOR; SIMULATION;

EID: 58149235137     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/45/455707     Document Type: Article

References (17)

1. Bhushan B 1999 Nanoscale tribophysics and tribomechanics Wear 225-229 465-92
2. Müller M, Schimmel T, Haubler P, Fettig H, Müller O and Albers A 2006 Finite element analysis of V-shaped cantilevers for atomic force microscopy under normal and lateral force loads Surf. Interface Anal. 38 1090-5
3. Liu E, Blanpain B and Celis J P 1996 Calibration procedures for frictional measurements with a lateral force microscope Wear 192 141
4. Varenberg M, Etsion I and Halperin G 2003 An improved wedge calibration method for lateral force in atomic force microscope Rev. Sci. Instrum. 74 3362-7
5. Hecht J 1992 Understanding LASERS An Entry-Level Guide (Piscataway, NJ: IEEE Press) ISBN 0-87942-298
6. Varenberg M, Etsion I and Halperin G 2003 Crosstalk problems in scanning-by-probe atomic force microscopy Rev. Sci. Instrum. 74 3569-71
7. Goldstein H 1980 Classical Mechanics 2nd edn (Reading, MA: Addison-Wesley) ISBN 0-201-02969-3
8. Ogletree D F, Carpick R W and Salmeron M 1996 Calibration of frictional forces in atomic force microscopy Rev. Sci. Instrum. 67 3298-306
9. Piner R and Ruoff R S 2002 Cross talk between friction height signals in atomic force microscopy Rev. Sci. Instrum. 73 3392-4
10. Li Q, Kim K S and Rydberg A 2006 Lateral force calibration of an atomic force microscope with a diamagnetic levitation spring system Rev. Sci. Instrum. 77 065105
11. Hoffmann A, Jungk T and Soergel E 2007 Cross-talk correction in atomic force microscopy Rev. Sci. Instrum. 78 016101
12. http://www.veeco.com - ref-separator -
13. http://www.spmtips.com - ref-separator -
14. http://www-cast3m.cea.fr - ref-separator -
15. http://www.code-aster.org - ref-separator -
16. Dimension 3100 manual Version 4.43B, 1-1:System Overview Figure 1.5e: Standard cantilever holder
17. Dimension 3100 manual 1.5.4 Dimension SPM Head