Correlating exchange bias with magnetic anisotropy in ion-beam bombarded NiFe/Mn-oxide bilayers

Journal of Applied Physics

Volumn 104, Issue 12, 2008, Pages

  Lin, K W ^a   Guo, J Y ^a   Chen, T J ^a   Ouyang, H ^b   Vass, E ^c   Van Lierop, J ^d  

^a NATIONAL CHUNG HSING UNIVERSITY   (Taiwan)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^c UNIVERSITY OF INNSBRUCK   (Austria)

^d UNIVERSITY OF MANITOBA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROMAGNETISM; ARGON; CHEMICAL MODIFICATION; ION BEAMS; ION EXCHANGE; MAGNETIC ANISOTROPY; MAGNETIC PROPERTIES; MANGANESE; OXIDATION; OXYGEN;

ANTIFERROMAGNETIC; BEAM DEPOSITIONS; BI LAYERS; EXCHANGE BIAS EFFECTS; EXCHANGE BIASES; FERRIMAGNET; IN-SITU; MN OXIDATIONS; OXYGEN CONCENTRATIONS; ROCK SALTS;

MANGANESE COMPOUNDS;

EID: 58149232310     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3040719     Document Type: Article

References (26)

1. J. Nogús, J. Sort, V. Langlais, V. Skumryev, S. Surinach, J. S. Munoz, and M. D. Baro, Phys. Rep. 0370-1573 10.1016/j.physrep.2005.08.004 422, 65 (2005).
2. A. E. Berkowitz and K. Takano, J. Magn. Magn. Mater. 0304-8853 10.1016/S0304-8853(99)00453-9 200, 552 (1999).
3. R. L. Stamps, J. Phys. D 0022-3727 10.1088/0022-3727/33/23/201 33, R247 (2000).
4. K. F. Eid, M. B. Stone, K. C. Ku, O. Maksimov, P. Schiffer, N. Samarth, T. C. Shih, and C. J. Palmstrøm, Appl. Phys. Lett. 0003-6951 10.1063/1.1787945 85, 1556 (2004).
5. G. Salazar-Alvarez, J. Sort, S. Surinach, M. D. Baro, and J. Nogues, J. Am. Chem. Soc. 0002-7863 10.1021/ja0714282 129, 9102 (2007).
6. A. E. Berkowitz, G. F. Rodriguez, J. I. Hong, K. An, T. Hyeon, N. Agarwal, D. J. Smith, and E. E. Fullerton, Phys. Rev. B 0163-1829 10.1103/PhysRevB.77.024403 77, 024403 (2008).
7. P. Z. Si, D. Li, J. W. Lee, C. J. Choi, Z. D. Chang, D. Y. Geng, and E. Bruck, Appl. Phys. Lett. 0003-6951 10.1063/1.2072807 87, 133122 (2005).
8. M. A. Morales, R. Skomski, S. Fritz, G. Shelburne, J. E. Shield, M. Ying, S. O'Brien, and D. L. Leslie-Pelecky, Phys. Rev. B 0163-1829 10.1103/PhysRevB.75.134423 75, 134423 (2007).
9. N. Wang, L. Guo, L. He, X. Cao, C. Chen, R. Wang, and S. Yang, Small 1613-6810 10.1002/smll.200600283 3, 606 (2007).
10. K. -W. Lin, P. -H. Ko, Z. -Y. Guo, H. Ouyang, and J. van Lierop, J. Nanosci. Nanotechnol. 7, 265 (2007). 1533-4880
11. J. van Lierop, K. -W. Lin, Z. -Y. Guo, P. -H. Ko, and H. Ouyang, J. Appl. Phys. 0021-8979 10.1063/1.2672440 101, 09E505 (2007).
12. K. -W. Lin, F. -T. Lin, Y. -M. Tzeng, and Z. -Y. Guo, Eur. Phys. J. B 1434-6028 10.1140/epjb/e2005-00181-8 45, 237 (2005).
13. J. van Lierop, K. -W. Lin, J. -Y. Guo, H. Ouyang, and B. W. Southern, Phys. Rev. B 0163-1829 10.1103/PhysRevB.75.134409 75, 134409 (2007).
14. J. van Lierop, B. W. Southern, K. -W. Lin, Z. -Y. Guo, C. L. Harland, R. A. Rosenberg, and J. W. Freeland, Phys. Rev. B 0163-1829 10.1103/PhysRevB.76. 224432 76, 224432 (2007).
15. K. -W. Lin, F. -T. Lin, and Y. -M. Tzeng, IEEE Trans. Magn. 41, 927 (2005). 0018-9464
16. K. -W. Lin, J. -Y. Guo, S. Kahwaji, S. -C. Chang, H. Ouyang, J. van Lierop, N. N. Phuoc, and T. Suzuki, Phys. Status Solidi A 0031-8965 10.1002/pssa.200777299 204, 3970 (2007).
17. K. -W. Lin, J. -Y. Guo, H. -Y. Liu, H. Ouyang, D. -H. Wei, and J. van Lierop, J. Appl. Phys. 0021-8979 10.1063/1.2837502 103, 07C105 (2008).
18. K. -W. Lin, R. J. Gambino, and L. H. Lewis, J. Appl. Phys. 0021-8979 10.1063/1.1543879 93, 6590 (2003).
19. K. -W. Lin, Y. -M. Tzeng, Z. -Y. Guo, C. -Y. Liu, and J. van Lierop, J. Magn. Magn. Mater. 0304-8853 10.1016/j.jmmm.2006.02.021 304, e124 (2006).
20. H. Ouyang, K. -W. Lin, C. -C. Liu, S. -C. Lo, Y. -M. Tzeng, Z. -Y. Guo, and J. van Lierop, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.98.097204 98, 097204 (2007).
21. K. -W. Lin, M. -R. Wei, and J. -Y. Guo, " Cooling field and ion-beam bombardment effects on exchange bias behavior in NiFe/(Ni,Fe)O bilayers.," J. Nanosci. Nanotechnol. (in press).
22. K. -W. Lin and J. -Y. Guo, " Tuning in-plane and out-of-plane exchange biases in Ni80 Fe20 /Cr -oxide bilayers.," J. Appl. Phys. (in press).
23. F. Radu, M. Etzkorn, R. Siebrecht, T. Schmitte, K. Westerholt, and H. Zabel, Phys. Rev. B 0163-1829 10.1103/PhysRevB.67.134409 67, 134409 (2003).
24. S. Brems, K. Temst, and C. van Haesendonck, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.99.067201 99, 067201 (2007).
25. D. Mauri, E. Kay, D. Scholl, and J. K. Howard, J. Appl. Phys. 0021-8979 10.1063/1.339374 62, 2929 (1987).
26. K. Dwight and N. Menyuk, Phys. Rev. 119, 1470 (1960).