Structural and magnetic characterization of ion-beam deposited NiFe/NixFe1-xO composite films

Journal of Applied Physics

Volumn 93, Issue 10 2, 2003, Pages 6590-6592

  Lin, K W ^a,c   Gambino, R J ^a   Lewis, L H ^b  

^a STONY BROOK UNIVERSITY   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c TOYOTA TECHNOLOGICAL INSTITUTE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ION BEAM ASSISTED DEPOSITION; MAGNETIC HYSTERESIS; NANOSTRUCTURED MATERIALS; NICKEL ALLOYS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

NANOCOMPOSITE FILMS;

MAGNETIC THIN FILMS;

EID: 0037639689     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1543879     Document Type: Conference Paper

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