In-plane and perpendicular exchange bias in [Pt/Co]/NiO multilayers

Physica Status Solidi (A) Applications and Materials Science

Volumn 204, Issue 12, 2007, Pages 3970-3974

  Lin, K W ^b   Guo, J Y ^b   Kahwaji, S ^a   Chang, S C ^b   Ouyang, H ^b   Van Lierop, J ^a   Phuoc, N N ^c   Suzuki, T ^c  

^a UNIVERSITY OF MANITOBA   (Canada)

^b NATIONAL CHUNG HSING UNIVERSITY   (Taiwan)

^c TOYOTA TECHNOLOGICAL INSTITUTE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

IN-PLANE EXCHANGE BIAS FIELDS; PERPENDICULAR EXCHANGE BIAS FIELDS; TEMPERATURE DEPENDENCE;

COERCIVE FORCE; FILM THICKNESS; MULTILAYERS; THERMAL EFFECTS;

NICKEL COMPOUNDS;

EID: 38049166452     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200777299     Document Type: Article

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