X-ray photoelectron spectroscopy and magnetic force microscopy studies of ion-beam deposited Ni80Fe20/Co-oxide bilayers

IEEE Transactions on Magnetics

Volumn 41, Issue 2, 2005, Pages 927-929

  Lin, Ko Wei ^a   Lin, Fu Tai ^a,b   Tzeng, Yi Min ^a  

^a NATIONAL CHUNG HSING UNIVERSITY   (Taiwan)

^b AU OPTRONICS CORPORATION   (Taiwan)

Author keywords

Exchange coupling; Ion beam deposition technique; NiFe Co oxide bilayers

Indexed keywords

ATOMIC FORCE MICROSCOPY; COERCIVE FORCE; DEPOSITION; ION BEAMS; MAGNETIC PROPERTIES; NICKEL COMPOUNDS; RANDOM ACCESS STORAGE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

EXCHANGE COUPLING; ION-BEAM DEPOSITION TECHNIQUE; MAGNETIC FORCE MICROSCOPY (MFM); NIFE/CO-OXIDE BILAYERS;

MAGNETIC FILMS;

EID: 14544297810     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2004.842125     Document Type: Article

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